Frequency-domain interferometric second-harmonic spectroscopy

Citation
Pt. Wilson et al., Frequency-domain interferometric second-harmonic spectroscopy, OPTICS LETT, 24(7), 1999, pp. 496-498
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTICS LETTERS
ISSN journal
01469592 → ACNP
Volume
24
Issue
7
Year of publication
1999
Pages
496 - 498
Database
ISI
SICI code
0146-9592(19990401)24:7<496:FISS>2.0.ZU;2-Z
Abstract
We report a new spectroscopic technique to measure simultaneously the inten sity and the phase of second-harmonic (SH) radiation over a broad spectral range without laser tuning. Temporally separated SH pulses from two sources , excited by the same broad-bandwidth 15-fs Ti:sapphire fundamental pulse, interfere in a spectrometer to yield frequency-domain interference fringes. We demonstrate the technique by measuring the strongly bias-dependent phas e of SH radiation from a Si/SiO2/Cr metal-oxide-semiconductor capacitor in the spectral range of the Si E-1 critical point. (C) 1999 Optical Society o f America.