POST-FRACTURE ANALYSES OF POLYETHYLENE-METAL INTERFACES

We have analyzed the surfaces created by peeling deuterated polyethyle ne films from copper, aluminum, and brass substrates. The polymer was analyzed for metal residues by X-ray photoelectron spectroscopy (XPS), while secondary-ion mass spectroscopy (SIMS) was used to detect deute rium on the metal. Optical microscopy always indicated apparent adhesi ve (i.e. interfacial) failure for all polymer-metal samples, but SIMS consistently showed extensive coverage by polymer at all exposed metal surfaces. XPS of the polymer revealed traces of metal on samples peel ed from copper and brass, but not from aluminum. Ellipsometry and elec tron microscopy confirmed the presence of a 60 +/- 20 Angstrom polymer layer on the metal surface.