Inelastic electron-boundary scattering in thin films

Authors
Citation
A. Sergeev, Inelastic electron-boundary scattering in thin films, PHYSICA B, 263, 1999, pp. 217-219
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA B
ISSN journal
09214526 → ACNP
Volume
263
Year of publication
1999
Pages
217 - 219
Database
ISI
SICI code
0921-4526(199903)263:<217:IESITF>2.0.ZU;2-D
Abstract
Inelastic electron scattering at the interface is one of the basic processe s of the electron-phonon interaction in thin films, nanostructures, and low -dimensional conductors. This scattering process determines the temperature -dependent resistivity and electron dephasing in a wide temperature range. It also provides a new channel for energy transfer from the film electrons to the substrate phonons. Inelastic electron-boundary scattering allows us to explain the observed decrease of the Kapitza conductivity at the transit ion to the superconducting state and a value of the Kapitza conductance for pairs of materials with rather different acoustic impedances. It results i n a nonequilibrium component of the photoresponse with a picosecond decay t ime proportional to the film thickness that has been recently observed in Y BaCuO ultrathin films. (C) 1999 Elsevier Science B.V. All rights reserved.