Vibrational density of states of thin films measured by inelastic scattering of synchrotron radiation

Authors
Rohlsberger, R Sturhahn, W Toellner, TS Quast, KW Alp, EE Bernhard, A Metge, J Ruffer, R Burkel, E
Citation
R. Rohlsberger et al., Vibrational density of states of thin films measured by inelastic scattering of synchrotron radiation, PHYSICA B, 263, 1999, pp. 581-583
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA B
ISSN journal
09214526 → ACNP
Volume
263
Year of publication
1999
Pages
581 - 583
Database
ISI
SICI code
0921-4526(199903)263:<581:VDOSOT>2.0.ZU;2-X
Abstract
Vibrational spectra of thin films were measured by inelastic nuclear resona nt scattering of synchrotron radiation in grazing incidence geometry. A str ong enhancement of the inelastic signal was obtained by designing the layer system as X-ray waveguide and coupling the incident beam into a guided mod e. This effect opens the possibility to study vibrational excitations in th in films that were so far impossible to obtain due to Aux limitations, (C) 1999 Elsevier Science B.V. All rights reserved.