Growth of biaxially oriented conductive LaNiO3 buffer layers on textured Ni tapes for high-T-c-coated conductors

Citation
Q. He et al., Growth of biaxially oriented conductive LaNiO3 buffer layers on textured Ni tapes for high-T-c-coated conductors, PHYSICA C, 314(1-2), 1999, pp. 105-111
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA C
ISSN journal
09214534 → ACNP
Volume
314
Issue
1-2
Year of publication
1999
Pages
105 - 111
Database
ISI
SICI code
0921-4534(19990301)314:1-2<105:GOBOCL>2.0.ZU;2-#
Abstract
Electrically conductive LaNiO3 buffer layers have been grown on textured ni ckel tapes by sputter deposition in a reducing atmosphere. These conductive buffered Ni tapes can be employed as long flexible substrates for biaxiall y aligned high-temperature superconductors, and can electrically stabilize the superconductor during transient loss of superconductivity. Deposition t emperatures of about 400 degrees C result in epitaxial growth of LaNiO3 fil ms, while higher deposition temperatures may cause the formation of La2NiO4 films. X-ray theta-2 theta, theta, and phi scans reveal that the LaNiO3 fi lms have good out-of-plane and in-plane orientations of 5 degrees and 9-10 degrees, respectively. Subsequent oxygen anneals at 750 degrees C and 850 d egrees C change neither the biaxial orientations of the film nor cause any cracks or other surface defects. The resistivity of the LaNiO3 films can be further reduced by increasing the annealing temperature and oxygen pressur e during post-annealing. Highly textured YBa2Cu3O7 (YBCO) films were grown on the LaNiO3-buffered Ni by pulsed laser deposition (PLD). (C) 1999 Elsevi er Science B.V. All rights reserved.