Dielectric properties of the semiconducting compounds Cd1-xFexTe

Authors
Zukowski, PV Partyka, J Wegierek, P Sidorenko, JW Szostak, JA Rodzik, A
Citation
Pv. Zukowski et al., Dielectric properties of the semiconducting compounds Cd1-xFexTe, SEMICONDUCT, 33(3), 1999, pp. 276-277
Citations number
6
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SEMICONDUCTORS
ISSN journal
10637826 → ACNP
Volume
33
Issue
3
Year of publication
1999
Pages
276 - 277
Database
ISI
SICI code
1063-7826(199903)33:3<276:DPOTSC>2.0.ZU;2-Z
Abstract
The dielectric permittivity and conductivity of Cd1-xFexTe compounds (0<x l ess than or equal to 0.03) are measured as functions of temperature and fre quency. It is found that the Fe atoms are distributed in a correlated fashi on in the Cd sublattice. (C) 1999 American Institute of Physics. [S1063-782 6(99)00203-3].