Study of the electronic bonding of Cl-Si(100) by synchrotron radiation photoemission spectroscopy and many-body calculations

Citation
Ja. Martin-gago et al., Study of the electronic bonding of Cl-Si(100) by synchrotron radiation photoemission spectroscopy and many-body calculations, SURF SCI, 424(1), 1999, pp. 82-93
Citations number
31
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
424
Issue
1
Year of publication
1999
Pages
82 - 93
Database
ISI
SICI code
0039-6028(19990319)424:1<82:SOTEBO>2.0.ZU;2-X
Abstract
The electronic structure of chlorine chemisorbed on a Si(100)-(2 x 1) surfa ce is investigated by means of synchrotron radiation photoemission spectros copy and many-body calculations of the one-hole density of states in order to study the effect of strong correlations in the adsorbate layer. The expe rimental spectrum stands in close agreement with previous experimental work . Three adsorption geometries were considered in the density of states (DOS ) calculations: (i) adsorption on both ends of symmetric Si dimers; (ii) ad sorption on only the upper Si atoms of buckled dimers; and (iii) a combinat ion of both. Although the energy of the DOS maxima was similar in the three cases, and in almost quantitative agreement with the experimental peaks be low the ionisation threshold (13 eV), their intensities and widths were str ongly different. Only when structures (i) and (ii) are mixed in the ratio 1 -2.5, as suggested by electron-stimulated desorption experiments, does the DOS strongly resemble the photoemission spectrum. These structural effects are also evident in the Cl chemisorption on Si vicinal surfaces, and subseq uent annealing of the chlorinated surface, which leads to similar electroni c states but with different intensities. The evolution of the experimental spectra with temperature suggests that weaker phases are desorbed, more bou nd species remaining only at the step edges and, after annealing, at the te rraces. (C) 1999 Elsevier Science B.V. All rights reserved.