Characterization of the five-fold plane surface of an Al70.4Pd21.4Mn8.2 quasi-crystal by means of surface X-ray diffraction

Citation
J. Alvarez et al., Characterization of the five-fold plane surface of an Al70.4Pd21.4Mn8.2 quasi-crystal by means of surface X-ray diffraction, SURF SCI, 423(2-3), 1999, pp. L251-L257
Citations number
29
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
423
Issue
2-3
Year of publication
1999
Pages
L251 - L257
Database
ISI
SICI code
0039-6028(19990310)423:2-3<L251:COTFPS>2.0.ZU;2-L
Abstract
The surface of a five-fold symmetry quasi-crystal of a thermodynamically st able icosahedral Al70.4Pd21.4Mn8.2 single grain has been studied by means o f X-ray diffraction. The calculated intensity reproduces rather well both t he Bragg peaks and surface signal. The fit of the measured structure factor shows a contraction of the outermost atomic layer. The system also tends t o be richer in Al and Pd, the atoms forming a very dense outer layer. (C) 1 999 Elsevier Science B.V. All rights reserved.