J. Alvarez et al., Characterization of the five-fold plane surface of an Al70.4Pd21.4Mn8.2 quasi-crystal by means of surface X-ray diffraction, SURF SCI, 423(2-3), 1999, pp. L251-L257
The surface of a five-fold symmetry quasi-crystal of a thermodynamically st
able icosahedral Al70.4Pd21.4Mn8.2 single grain has been studied by means o
f X-ray diffraction. The calculated intensity reproduces rather well both t
he Bragg peaks and surface signal. The fit of the measured structure factor
shows a contraction of the outermost atomic layer. The system also tends t
o be richer in Al and Pd, the atoms forming a very dense outer layer. (C) 1
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