Growth mechanism of 7 x 7 domains from the '1 x 1' phase on a quenched Si(111) surface studied by high temperature STM

Citation
M. Chida et al., Growth mechanism of 7 x 7 domains from the '1 x 1' phase on a quenched Si(111) surface studied by high temperature STM, SURF SCI, 423(1), 1999, pp. L236-L243
Citations number
18
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
423
Issue
1
Year of publication
1999
Pages
L236 - L243
Database
ISI
SICI code
0039-6028(19990301)423:1<L236:GMO7X7>2.0.ZU;2-6
Abstract
Growth processes of 7 x 7 domains from the '1 x 1' phase on quenched Si(lll ) surfaces were studied by high temperature STM at a temperature around 340 degrees C, which is more than 100 degrees C lower than temperatures at whi ch previous studies had been carried out. Several metastable structure unit s were newly found, which play essential roles in the transformation to the dimer adatom stacking fault (DAS) structures. Basic restructuring processe s were found to be shifts of dimer lines, which surround a faulted triangle , along and perpendicular to the line. (C) 1999 Elsevier Science B.V. All r ights reserved.