The influence of a modulated crossed magnetic field on silicon particles ha
le been investigated by a laser light scattering method and a field emissio
n scanning electron microscopy (FESEM) in SiH4(10%)/Ar plasmas. In the init
ial stage of silane discharge, the fluctuation of discharge current due to
the modulated crossed magnetic field being applied is drastically decreased
, then the density of silicon particles removed from the discharge space is
increased and the average radius of the removed silicon particles is kept
smaller than 10 nm of the detecting limit of FESEM. It is suggested that th
e small silicon particles in the stage of the initial growth are effectivel
y removed from the discharge space and the fluctuation of discharge current
is related to the nucleation and the growth of silicon particles. (C) 1999
Elsevier Science S.A. All rights reserved.