Effect of cohesive energy on atomic transport in ion beam mixed Co/Pt bilayer film

Citation
Gs. Chang et al., Effect of cohesive energy on atomic transport in ion beam mixed Co/Pt bilayer film, THIN SOL FI, 341(1-2), 1999, pp. 234-237
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
341
Issue
1-2
Year of publication
1999
Pages
234 - 237
Database
ISI
SICI code
0040-6090(19990312)341:1-2<234:EOCEOA>2.0.ZU;2-I
Abstract
A Co/Pt bilayer was chosen to study the effect of cohesive energy on atomic transport induced by ion beam mixing in a radiation enhanced diffusion reg ime without a thermochemical driving force. because of the large difference in mass and cohesive energy between Co and Pt, and the nearly zero heat of mixing. Pt(29 nm)/Co(40 nmn) bilayer films were deposited onto an SiO2 sub strate at 30-80 degrees C in a high vacuum by alternating electron-beam eva poration. Two Pd layers of a thickiness 1 nm were embedded as marker layers by thermal evaporation during the preparation of the bilayer film. The pre pared film was irradiated by 80 keV Ar+ with a dose of 1.5 x 10(16) ions/cm (2) in the substrate temperature range 77-570 K. The amount of atomic trans port of the constituent elements and the shifts in position of the Pd marke rs were evaluated by Rutherford backscattering spectroscopy. The atomic flu x ratio (J(Co)/J(Pt)) was found to be similar to 1 and similar to 5 at 77 K and 570 K, respectively. The measured atomic flux ratio is compared with t he theoretical value based on our proposed model which describes the atomic transport in terms of the difference in cohesive energies. (C) 1999 Elsevi er Science S.A. All rights reserved.