HYDROSTATIC-PRESSURE EFFECT ON POINT-DEFECT ELECTRONIC STATES IN NARROW-GAP AND GAPLESS SEMICONDUCTORS

Citation
Mv. Strikha et Ft. Vasko, HYDROSTATIC-PRESSURE EFFECT ON POINT-DEFECT ELECTRONIC STATES IN NARROW-GAP AND GAPLESS SEMICONDUCTORS, Physica status solidi. b, Basic research, 181(1), 1994, pp. 181-188
Citations number
15
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
03701972
Volume
181
Issue
1
Year of publication
1994
Pages
181 - 188
Database
ISI
SICI code
0370-1972(1994)181:1<181:HEOPES>2.0.ZU;2-K
Abstract
A study is made of the influence of hydrostatic pressure on point defe ct states in narrow-gap and gapless semiconductors, described by the t hree-band Kane model. It is shown that shifts of energy levels of cent res of different symmetry with pressure are different. The h-centre le vel follows strictly the v-band top. On the contrary, the 1-c level sh ift depends on pressure in a more complicated way, and is determined b y system parameters. The transition from resonance to localized defect states due to the transition from gapless to narrow-gap semiconductor s caused by hydrostatic pressure is also studied.