SILVER MIGRATION - ITS FORGOTTEN

The elektrolytic metal migration is a failure mechanism in electronic and electrotechnical components, devices, and equipments. The paper pr esents a review of silver migration phenomena especially, The conditio ns and anodic oxidation are also treated. Silver migrations lead to de scribe formation and eventually cause failure stages. Possibilities an d evaluation of faults are discussed. Inhibition or prevention of silv er migration are reviewed in light of the environmental conditions, co nductor composition, and dielectric substrates.