POINT-DEFECT CLUSTERS IN PB1-XINXTE SINGLE-CRYSTALS REVEALED BY X-RAYDIFFUSE-SCATTERING METHOD

Authors
ZLOMANOV VP CHTCHERBATCHEV KD TKALICH AK
Citation
Vp. Zlomanov et al., POINT-DEFECT CLUSTERS IN PB1-XINXTE SINGLE-CRYSTALS REVEALED BY X-RAYDIFFUSE-SCATTERING METHOD, Journal of solid state chemistry, 137(1), 1998, pp. 119-121
Citations number
9
Categorie Soggetti
Chemistry Inorganic & Nuclear","Chemistry Physical
Journal title
Journal of solid state chemistry → ACNP
ISSN journal
00224596
Volume
137
Issue
1
Year of publication
1998
Pages
119 - 121
Database
ISI
SICI code
0022-4596(1998)137:1<119:PCIPSR>2.0.ZU;2-5
Abstract
The method of X-ray diffuse scattering is used to characterize the poi nt defect structure in Pb1-xInxTe (x = 0.005-0.055) single crystals, I t is found that clusters of both vacancy and interstitial defects are present in all samples, but the ratio of their concentrations varies d epending on the doping level. The clusters of interstitial point defec ts are supposed to be dislocation loops formed from Pb-i and Te-i, whi le the clusters of vacancy-type defects may be formed from complexes o f In atoms and tellurium vacancies. (C) 1998 Academic Press.