T. Yano et al., X-RAY-DIFFRACTOMETRY AND HIGH-RESOLUTION ELECTRON-MICROSCOPY OF NEUTRON-IRRADIATED SIC TO A FLUENCE OF 1.9X10(27)N M(2)/, Journal of nuclear materials, 253, 1998, pp. 78-86
Citations number
20
Categorie Soggetti
Nuclear Sciences & Tecnology","Mining & Mineral Processing","Material Science
Neutron-induced damage in SLC up to a fluence of 1.9 x 10(27) n/m(2) (
E > 0.1 MeV) was examined by means of X-ray diffractometry and high-re
solution electron microscopy. Specimens of beta-SiC were irradiated in
fast breeder reactors at 370 to 650 degrees C. The lattice parameters
of all specimens were increased by the irradiation, but above 2 X 10(
26) n/m(2) lattice expansion decreased and was accompanied by signific
ant peak broadening. Electron microscopy revealed a high density of in
terstitial loops on {111}, where X-ray diffraction peaks showed marked
broadening. Peak broadening could be attributed mainly to the crystal
lite size effect at lower fluences, but a strain contribution was sign
ificant above 2 X 10(26) n/m(2). Electron diffraction patterns and hig
h-resolution images indicated preservation of crystallinity up to the
highest fluence observed. Thermal annealing up to 1000 degrees C did n
ot affect the peak broadening and average loop diameter. Above 1400 de
grees C, decrease in lattice strain and increase in crystallite size w
ith increasing annealing temperature were observed, (C) 1998 Elsevier
Science B,V.