BARKHAUSEN NOISE AND EDDY-CURRENT MICROSCOPY, A NEW SCANNING PROBE TECHNIQUE FOR MICROSCALE CHARACTERIZATION OF MATERIALS

Authors
ALTPETER I BENDER J HOFFMANN J KOPP M
Citation
I. Altpeter et al., BARKHAUSEN NOISE AND EDDY-CURRENT MICROSCOPY, A NEW SCANNING PROBE TECHNIQUE FOR MICROSCALE CHARACTERIZATION OF MATERIALS, Praktische Metallographie, 35(3), 1998, pp. 126-135
Citations number
9
Categorie Soggetti
Metallurgy & Metallurigical Engineering
Journal title
Praktische Metallographie → ACNP
ISSN journal
0032678X
Volume
35
Issue
3
Year of publication
1998
Pages
126 - 135
Database
ISI
SICI code
0032-678X(1998)35:3<126:BNAEMA>2.0.ZU;2-W
Abstract
Expectations in lateral resolution and quantitative measuring results in material development are permanently growing. The interest is focus ed on microstructure characterization, on detection of micro failures as well as on the evaluation of the distribution of mechanical propert ies such as residual stress or hardness. These requirements meet with the development of high resolution nondestructive methods such as the Barkhausen Noise and Eddy current Microscopy.