If. Tsu et al., GRAIN MORPHOLOGY AND CATION COMPOSITION HETEROGENEITY OF PB(ZRXTI1-X)O-3 THIN-FILMS DEPOSITED BY METAL-ORGANIC CHEMICAL-VAPOR-DEPOSITION, Journal of materials research, 13(6), 1998, pp. 1614-1625
The preferred orientation, grain morphology, and composition heterogen
eity of the polycrystalline Pb(ZrxTi1-x)O-3 (PZT) thin films were char
acterized by x-ray diffraction (XRD), scanning electron microscopy (SE
M), atomic force microscopy (AFM), transmission electron microscopy (T
EM), and x-ray energy dispersive spectroscopy (EDS). PZT thin films wi
th nominal x = 0.5 were grown by metal-organic chemical vapor depositi
on (MOCVD) on (110)- and (101)-textured RuO2 bottom electrodes at temp
eratures less than or equal to 525 degrees C. Columnar grain microstru
cture with strongly faceted surface morphology was observed in both fi
lms. The grain morphology and surface roughness of the PZT films were
observed to depend on those of the underlying RuO2 layers. TEM-EDS ana
lysis shows notable cation composition heterogeneity in length scales
of 0.2-2 mu m. Pronounced Pb composition deficiency and heterogeneity
were also observed in PZT/(110)RuO2 in length scales above 40 mu m. Th
e grain morphology and cation heterogeneity of the PZT films are discu
ssed on the basis of diffusion-limited columnar growth mechanism.