STUDY ON MICROSTRUCTURAL CHARACTERIZATION AND FERROMAGNETIC-RESONANCEIN SPUTTERED CO V MULTILAYERS/

The structure and magnetic properties of a series of rf sputtered [Co( 15 Angstrom)/V(d(V))](20) (5 Angstrom less than or equal to d(V) less than or equal to 40 Angstrom) multilayers have been studied. The multi layer structure is found by X-ray diffraction, cross-section transmiss ion electron microscopy (TEM), and high-resolution TEM (HRTEM) to be p olycrystalline with small individual column grains and has fairly stro ng f.c.c. Co(lll) and b.c.c. V(110) texture in the film growth directi on. The structural characterizations also show composition-modulated s tructures and severely alloyed effect. Ferromagnetic resonance (FMR) m easurements show relatively small g-factors (1.98 less than or equal t o g less than or equal to 2.06) and 4 pi M-eff values (about 0.9 T), w hich also indicate that the multilayers are severely alloyed. Complica ted spin wave resonance (SWR) spectra were observed and analyzed. The evaluated small interlayer coupling constants, A(g) = 0.33 x 10(-7) J/ cm(2) and A(eff) = 1.19 x 10(-14) J/cm, show the effect of weak exchan ge coupling between Co layers across V spacers.