Sb. Kim et al., REALIZATION OF VERTICALLY STACKED INGAAS GAAS QUANTUM WIRES ON V-GROOVES WITH (322) FACET SIDEWALLS BY CHEMICAL BEAM EPITAXY/, ETRI journal, 20(2), 1998, pp. 231-240
We report, for the first time, the fabrication of vertically stacked I
nGaAs/GaAs quantum wires (QWRs) on V-grooved substrates by chemical be
am epitaxy (CBE). To fabricate the vertically stacked QWRs structure,
we have grown the GaAs resharpening barrier layers on V-grooves with (
100)-(322) facet configuration instead of (100)-(111) base at 450 degr
ees C. Under the conditions of low growth temperature, the growth rate
of GaAs on the (322) sidewall is higher than that at the (100) bottom
. Transmission electron microscopy verifies that the vertically stacke
d InGaAs QWRs were formed in sizes of about 200 Angstrom x 500 similar
to 600 Angstrom. Three distinct photoluminescence peaks related with
side-quantum welts (QWLs), top-QWLs and QWRs were observed even at 200
K due to sufficient carrier and optical confinement. These results st
rongly suggest;the existence of the quantized state in the vertically
stacked InGaAs/GaAs QWRs grown by CBE.