VANADIUM SPECIATION BY EDXRF

Elemental chemical speciation by measuring x-ray energy shifts has bee n carried out by various authors in the past, using tube excitation an d wavelength detection. Among the most intense determined shifts are t hose of vanadium compounds; further, vanadium speciation determination seems to be even more important than total element analysis. In this work, the possibility of vanadium compound speciation by measuring K x -ray line energy shifts was studied by using radioactive source excita tion and detection by an energy-dispersive Si(Li) detector of moderate resolution. The effect of the fitting parameters to the results was e xamined for the K-L-2,L-3 and K-M-2,M-3 lines, and the results are com pared with previous data obtained by wavelength-dispersive x-ray fluor escence. (C) 1998 John Wiley & Sons, Ltd.