INFRARED-EMISSION CHARACTERIZATION OF POLYCRYSTALLINE DIAMOND FILMS

Infra-red emission has been used to characterize polycrystalline diamo nd films of differing qualities, produced by de arcjet chemical vapor deposition. Intrinsic and defect-induced bands were observed from samp les heated in a low emissivity cell using Fourier Transform Infra-red spectroscopy (FTIR). In addition, the IR emission and absorption spect ra of polished IIa and Ib single crystal diamonds were measured to com pare the intrinsic and nitrogen-induced absorption and emission bands. Emission features observed included the intrinsic two phonon bands, d efect-induced one phonon bands (from symmetry breaking), nitrogen-rela ted bands, and CH stretching bands. Complementary information on the q uality and defects in the samples was provided using photoluminescence and Raman spectroscopies. (C) 1998 Elsevier Science S.A.