THE INFLUENCE OF SUBSTRATE-TEMPERATURE AND ANNEALING ON PHASE-FORMATION AND CRYSTALLINE PROPERTIES OF BISMUTH TITANATE FILM BY APMOCVD

Citation
H. Wang et al., THE INFLUENCE OF SUBSTRATE-TEMPERATURE AND ANNEALING ON PHASE-FORMATION AND CRYSTALLINE PROPERTIES OF BISMUTH TITANATE FILM BY APMOCVD, Journal of physics. D, Applied physics, 27(2), 1994, pp. 393-395
Citations number
11
Categorie Soggetti
Physics, Applied
ISSN journal
00223727
Volume
27
Issue
2
Year of publication
1994
Pages
393 - 395
Database
ISI
SICI code
0022-3727(1994)27:2<393:TIOSAA>2.0.ZU;2-X
Abstract
Bismuth titanate thin films have been grown by the atmospheric pressur e metal-organic chemical vapour deposition technique. The influences o f substrate temperature and annealing on phase formation and crystalli ne properties have been studied. (100) oriented Bi4Ti3O12 films have b een grown at 550-degrees-C, while (001) preferred orientation films we re obtained at high temperature (about 800-degrees-C) annealing. At a temperature of 650-750-degrees-C, a film with Bi4Ti3O12+Bi2Ti2O7 phase s was formed. It is shown that the phase formation may depend upon the growth temperature and composition of film. The orientation of films mainly depended upon the lattice match with substrate.