FEMTOSECOND 2-PHOTON LASER PHOTOELECTRON MICROSCOPY

Authors
SEKATSKII SK CHEKALIN SV IVANOV AL MATVEETS YA STEPANOV AG LETOKHOV VS
Citation
Sk. Sekatskii et al., FEMTOSECOND 2-PHOTON LASER PHOTOELECTRON MICROSCOPY, The journal of physical chemistry. A, Molecules, spectroscopy, kinetics, environment, & general theory, 102(23), 1998, pp. 4148-4153
Citations number
32
Categorie Soggetti
Chemistry Physical
Journal title
The journal of physical chemistry. A, Molecules, spectroscopy, kinetics, environment, & general theory → ACNP
ISSN journal
10895639
Volume
102
Issue
23
Year of publication
1998
Pages
4148 - 4153
Database
ISI
SICI code
1089-5639(1998)102:23<4148:F2LPM>2.0.ZU;2-4
Abstract
It is shown that high-resolution photoelectron images (with a resoluti on of up to 3 nm for ultrasharp silicon tips) can be obtained for prac tically all materials when irradiating tips made of these materials by pulses of the second harmonic of a femtosecond Ti:sapphire laser. In addition to the images, absolute values of the two-photon external pho toelectric effect for these tips also can be measured using this metho d. The first experimental realization of this two-photon femtosecond l aser projection photoelectron microscope is presented, and correspondi ng data for silicon, diamond, and calcium fluoride tips are analyzed.