H. Lim et al., ACTIVATION-ENERGIES FOR THE FRAGMENTATION OF THIOPHENE IONS BY SURFACE-INDUCED DISSOCIATION, JOURNAL OF PHYSICAL CHEMISTRY B, 102(23), 1998, pp. 4573-4580
We have improved our previously described method for extracting activa
tion energies of fragmentation for polyatomic ions from surface-induce
d dissociation (SID) data [Wainhaus, S. B.; et al. J. Am. Chem. Sec. 1
997, 119, 4001]. Our method analyzes the energy-resolved mass spectra
and the kinetic energy distribution spectra of the parent and fragment
ions that scatter off the surface. It extracts the activation energie
s by integrating over the distribution of the initial ion energy and t
he energy transferred to the surface, taking into account both the ave
rage value and the width of these distributions. The new method gave i
mproved activation energies for SiMe3+ --> SiMex+ (x = 0-2) fragmentat
ion at a hexanethiolate-covered gold surface. We then used our data an
alysis method to analyze the activation energies for the fragmentation
of thiophene ions at the hexanethiolate-covered gold surface. The act
ivation energies for the formation of C2H2S+, CHS+, and C3H3+ from C4H
4S+ were found to be 4.6 +/- 0.7, 6.9 +/- 0.7, and 6.5 +/- 0.7 eV, res
pectively. Our activation energy results followed the trend in the val
ues from threshold photoelectron photoion coincidence data. However, t
he SLD values were similar to 50% higher than the threshold photoelect
ron photoion coincidence values; this discrepancy mostly resulted from
delayed dissociation. This model may be used to extract quantitative
activation energies from SID data once certain ongoing issues are reso
lved in future papers. Molecular dynamics simulations were also perfor
med to assist in the data analysis and to test the assumptions of ener
gy transfer in this system. Qualitative agreement in energy transfer w
as found between the experiments and simulations.