P. Vaterlein et al., SIMULATION OF RESONANTLY AND OFF-RESONANTLY EXCITED X-RAY-EMISSION SPECTRA - AN APPLICATION FOR THE X-ALPHA SCATTERED-WAVE METHOD, Physical review. A, 57(6), 1998, pp. 4275-4278
It is shown that the X alpha scattered-wave method is particularly use
ful to simulate high-resolution x-ray-emission (XE) spectra of molecul
es. Calculations for both the resonant and off-resonant C K XE spectra
of benzene have been performed. In the off-resonant case the ability
of this method to calculate the cross sections of the primary core ion
ization is crucial and multichannel interference effects may be signif
icant. Furthermore, we discuss the treatment of molecular symmetry in
modeling x-ray processes and the interpretation of x-ray emission as a
n inelastic scattering process.