SIMULATION OF RESONANTLY AND OFF-RESONANTLY EXCITED X-RAY-EMISSION SPECTRA - AN APPLICATION FOR THE X-ALPHA SCATTERED-WAVE METHOD

Citation
P. Vaterlein et al., SIMULATION OF RESONANTLY AND OFF-RESONANTLY EXCITED X-RAY-EMISSION SPECTRA - AN APPLICATION FOR THE X-ALPHA SCATTERED-WAVE METHOD, Physical review. A, 57(6), 1998, pp. 4275-4278
Citations number
18
Categorie Soggetti
Physics
Journal title
ISSN journal
10502947
Volume
57
Issue
6
Year of publication
1998
Pages
4275 - 4278
Database
ISI
SICI code
1050-2947(1998)57:6<4275:SORAOE>2.0.ZU;2-7
Abstract
It is shown that the X alpha scattered-wave method is particularly use ful to simulate high-resolution x-ray-emission (XE) spectra of molecul es. Calculations for both the resonant and off-resonant C K XE spectra of benzene have been performed. In the off-resonant case the ability of this method to calculate the cross sections of the primary core ion ization is crucial and multichannel interference effects may be signif icant. Furthermore, we discuss the treatment of molecular symmetry in modeling x-ray processes and the interpretation of x-ray emission as a n inelastic scattering process.