HIGH-RESISTIVITY ZNSE COATED SUBSTRATES FOR MICROSTRIP GAS-CHAMBERS

Citation
R. Sudharsanan et al., HIGH-RESISTIVITY ZNSE COATED SUBSTRATES FOR MICROSTRIP GAS-CHAMBERS, IEEE transactions on nuclear science, 45(3), 1998, pp. 285-289
Citations number
12
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
ISSN journal
00189499
Volume
45
Issue
3
Year of publication
1998
Pages
285 - 289
Database
ISI
SICI code
0018-9499(1998)45:3<285:HZCSFM>2.0.ZU;2-6
Abstract
Microstrip gas chambers (MSGCs) require substrates with sheet resistan ce in the range of 10(13)-10(16) ohms/square to eliminate polarization and surface charging effects between the electrodes. Thin films of II -VI semiconductors deposited on glass or plastic substrates are attrac tive for this application since bulk resistivity of these semiconducto rs vary in the range 10(9)-10(12) ohm-cm and films with good uniformit y can be deposited over large-areas using inexpensive deposition techn iques. In this paper, deposition, characterization, and fabrication of MSGCs using ZnSe thin films are reported for the first time. ZnSe thi n films were deposited on glass and plastic substrates by thermal evap oration. Sheet resistance of ZnSe varied in the range of 10(15) to 10( 16) ohms/square depending on the deposition conditions. A MSGC detecto r fabricated using a 0.5 mu m thick ZnSe layer on glass substrate exhi bited best values; gas gain of 25000 and an energy resolution of about 16.7% FWHM at a gain of 1080 for a Fe-55 source.