STABILITY OF THE EMISSION FREQUENCY OF SEMICONDUCTOR-LASERS FOR INTERFEROMETRIC MEASUREMENTS

Authors
PARFENOV VA BESPALOV VG
Citation
Va. Parfenov et Vg. Bespalov, STABILITY OF THE EMISSION FREQUENCY OF SEMICONDUCTOR-LASERS FOR INTERFEROMETRIC MEASUREMENTS, Journal of optical technology, 65(6), 1998, pp. 462-464
Citations number
6
Categorie Soggetti
Optics
Journal title
Journal of optical technology → ACNP
ISSN journal
10709762
Volume
65
Issue
6
Year of publication
1998
Pages
462 - 464
Database
ISI
SICI code
1070-9762(1998)65:6<462:SOTEFO>2.0.ZU;2-1
Abstract
This paper presents the results of experiments on the measurement of t he long-term stability of the emission frequency of temperature-stabil ized semiconductor AlGaAs/GaAs lasers. It is concluded that it is prom ising to use these lasers in interferometric systems that need a radia tion source with small mass and size. (C) 1998 The Optical Society of America.