HELIUM MICROWAVE-INDUCED PLASMAS FOR ELEMENT-SPECIFIC DETECTION IN CHROMATOGRAPHY

This review addresses the development and use of the microwave-induced plasma (MIP) using optical emission spectrometry for the purpose of e lement specific detection in chromatography. The plasma source that is the focus of this article is the He-based MIP operated at atmospheric pressure. The forms of chromatography that are covered include gas ch romatography, liquid chromatography, and supercritical fluid chromatog raphy. Concepts in plasma cavity design and the chromatograph-plasma i nterface are discussed along with the application of these hybrid syst ems to analytical determinations.