SEB OCCURRENCE IN A VIP - INFLUENCE OF THE EPI-SUBSTRATE JUNCTION

Authors
LORFEVRE E SUDRE C DACHS C DETCHEVERRY C PALAU JM GASIOT J CALVET MC GARNIER J ECOFFET R
Citation
E. Lorfevre et al., SEB OCCURRENCE IN A VIP - INFLUENCE OF THE EPI-SUBSTRATE JUNCTION, IEEE transactions on nuclear science, 45(3), 1998, pp. 1624-1627
Citations number
8
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
Journal title
IEEE transactions on nuclear science → ACNP
ISSN journal
00189499
Volume
45
Issue
3
Year of publication
1998
Part
3
Pages
1624 - 1627
Database
ISI
SICI code
0018-9499(1998)45:3<1624:SOIAV->2.0.ZU;2-L
Abstract
Heavy ion induced burnout is reported for the first time, in different parts of a VIP. A 2D-simulation investigation allows a better underst anding of this phenomenon and shows the importance of the epi-substrat e junction parameters in the SEE occurrence.