ATOMIC-FORCE MICROSCOPY - IMAGING WITH ELECTRICAL DOUBLE-LAYER INTERACTIONS

Authors
SENDEN TJ DRUMMOND CJ KEKICHEFF P
Citation
Tj. Senden et al., ATOMIC-FORCE MICROSCOPY - IMAGING WITH ELECTRICAL DOUBLE-LAYER INTERACTIONS, Langmuir, 10(2), 1994, pp. 358-362
Citations number
39
Categorie Soggetti
Chemistry Physical
Journal title
Langmuir → ACNP
ISSN journal
07437463
Volume
10
Issue
2
Year of publication
1994
Pages
358 - 362
Database
ISI
SICI code
0743-7463(1994)10:2<358:AM-IWE>2.0.ZU;2-Z
Abstract
The relationship between atomic force microscope (AFM) surface images and tip-sample surface forces in aqueous electrolyte solutions is exam ined. Two novel AFM imaging modes, designated as electrical double lay er and ''hydration'', are compared with the conventional Born ''contac t'' mode of imaging. Fourier analysis suggests that AFM images may rev eal correlation lengths and order parameters characteristic of surface forces.