X-RAY-SCATTERING STUDIES OF SURFACES AND INTERFACES

Here we shall briefly review the basics and some applications of x-ray specular reflectivity and diffuse scattering techniques. These x-ray scattering techniques are uniquely suited to study of the structure of surfaces and interfaces at atomic resolutions as they are nondestruct ive and can probe even interfaces which are buried. The study of struc ture of surfaces and interfaces is not only required in understanding physics in reduced dimensions but is also essential in developing tech nologically important materials. (C) 1998 Elsevier Science Ltd. All ri ghts reserved.