STUDIES ON DAMAGE-INDUCED BY 45 AND 80 MEV BORON IONS IN CRYSTALLINE SILICON

Authors
CHAVAN ST BHORASKAR VN
Citation
St. Chavan et Vn. Bhoraskar, STUDIES ON DAMAGE-INDUCED BY 45 AND 80 MEV BORON IONS IN CRYSTALLINE SILICON, Radiation physics and chemistry, 51(4-6), 1998, pp. 515-516
Citations number
2
Categorie Soggetti
Nuclear Sciences & Tecnology","Chemistry Physical","Physics, Atomic, Molecular & Chemical
Journal title
Radiation physics and chemistry → ACNP
ISSN journal
0969806X
Volume
51
Issue
4-6
Year of publication
1998
Pages
515 - 516
Database
ISI
SICI code
0969-806X(1998)51:4-6<515:SODB4A>2.0.ZU;2-N