DIFFUSION OF EXCITONS IN CDS-SE AND ZNSE-TE SOLID-SOLUTIONS AT HIGH-EXCITATION LEVELS

It is shown that, with strong pulsed excitation, the intensity of the exciton recombination band in the fluctuation tail of the density of s tates in the limit of large times in the presence of traps is describe d by the asymptote of a solution to the diffusion equation. The critic al diffusion index corresponds to a ''normal'' process in the CdS-Se s olid solution and to ''anomalous'' diffusion in the case of ZnSe-Te. ( C) 1998 American Institute of Physics.