QUANTITATIVE-ANALYSIS OF SCANNING TUNNELING MICROSCOPE IMAGES OF FE GROWN EPITAXIALLY ON MGO(001) USING LENGTH-DEPENDENT VARIANCE MEASUREMENTS

Authors
JORDAN SM SCHAD R LAWLER JF HERRMANN DJL VANKEMPEN H
Citation
Sm. Jordan et al., QUANTITATIVE-ANALYSIS OF SCANNING TUNNELING MICROSCOPE IMAGES OF FE GROWN EPITAXIALLY ON MGO(001) USING LENGTH-DEPENDENT VARIANCE MEASUREMENTS, Journal of physics. Condensed matter, 10(21), 1998, pp. 355-358
Citations number
18
Categorie Soggetti
Physics, Condensed Matter
Journal title
Journal of physics. Condensed matter → ACNP
ISSN journal
09538984
Volume
10
Issue
21
Year of publication
1998
Pages
355 - 358
Database
ISI
SICI code
0953-8984(1998)10:21<355:QOSTMI>2.0.ZU;2-N
Abstract
The roughness parameters of STM images of bce Fe grown epitaxially on MgO(100) were analysed as a function of growth temperature in the rang e between 295 K and 595 K. The images were evaluated by means of lengt h-dependent variance measurements revealing both vertical and lateral roughness information. The correlation length increased from 15 to 30 nm and the rms roughness decreased with increasing growth temperature whereas the fractal dimension remained constant.