A MEASUREMENT SET-UP FOR PHOTOCONDUCTIVITY DECAY EXPERIMENTS

Measurements of photoconductivity decay from the steady state for samp les of amorphous silicon and silicon-carbon alloys were carried out us ing the experimental set-up with a Pockels cell as a light chopper. Th e developed electronic switching circuit allows measurements of decay times ranging down to microseconds. The advantage of the adopted metho d of light switching is that one can easily control the light intensit y and photon energy. From knowledge of the photoconductivity decay tim e and the value of the steady state photoconductivity for a given samp le, the carrier drift mobility can be calculated.