Wc. Chang et al., CHARACTERISTICS OF PROTON-EXCHANGED WET ETCHING ON Z-CUT NICKEL-INDIFFUSED LITHIUM-NIOBATE, Microwave and optical technology letters, 18(4), 1998, pp. 250-252
In this letter, the wet etching technique is utilized to determine the
proton exchange (PE) depth of z-cut nickel-indiffused lithium niobate
under different nickel indiffusion parameters. It is demonstrated tha
t the existence of nickel atoms reduces the PE depth. While this resul
t was applied to the fabrication of a ridge-type waveguide, the lilt a
ngle of the sidewall on the ridge waveguide was about 70 degrees, whic
h has been successfully increased (C) 1998 John Wiley & Sons, Inc.