M. Batchelder et G. Cressey, RAPID, ACCURATE PHASE QUANTIFICATION OF CLAY-BEARING SAMPLES USING A POSITION-SENSITIVE X-RAY-DETECTOR, Clays and clay minerals, 46(2), 1998, pp. 183-194
The rapid phase quantification method using X-ray diffraction (XRD) wi
th a position-sensitive detector (PSD), outlined by Cressey and Schofi
eld (1996), has been extended to facilitate mineral phase quantificati
on of clay-bearing samples. In addition, correction factors for differ
ences in matrix absorption effects have been calculated and applied. T
ile method now enables mudrock mineralogy to be quantified rapidly and
efficiently. Using this approach overcomes many of the problems hithe
rto associated with the quantitative analysis of clay minerals, in par
ticular the effects of preferred orientation of crystallites and varia
ble sample-area irradiation, that make the task of quantification extr
emely difficult by conventional Bragg-Brentano scanning diffractometry
.