K. Sugahara et al., DIAGNOSIS OF MICROWAVE PLASMA CVD FOR DIAMOND GROWTH BY PLASMA IMPEDANCE MEASUREMENT, Diamond films and technology, 8(1), 1998, pp. 9-17
Citations number
9
Categorie Soggetti
Material Science","Materials Science, Coatings & Films
We have attempted to set up a new diamond CVD apparatus equipped with
a plasma impedance monitor in the microwave circuit. The advantages of
this apparatus are: (1) the remote sensing of CVD plasma, (2) real-ti
me sensing, (3) high sensitivity and (4) monitoring of reactor contami
nation. Since our microwave impedance monitor responds only to electro
n motion, we could obtain information on plasma electrons separately f
rom ionic motion. As a result, we confirmed the change in plasma imped
ance under the variations of microwave power, total gas (H,) pressure
and oxygen addition. The particular importance of this experiment was
the new finding that a small amount of oxygen enhances plasma excitati
on. Highly reproducible diamond CVD was obtained by in situ oxygen ash
ing of the reactor tube under impedance monitoring.