EPITAXIAL-GROWTH WITH PHOSPHORUS - 3 - FORMATION OF INDIUM-PHOSPHIDE THIN-FILMS USING CYCLOHEXYLPHOSPHINE, (C6H11)PH2, AS THE ORGANOPHOSPHORUS SOURCE COMPOUND
Ja. Glass et Jt. Spencer, EPITAXIAL-GROWTH WITH PHOSPHORUS - 3 - FORMATION OF INDIUM-PHOSPHIDE THIN-FILMS USING CYCLOHEXYLPHOSPHINE, (C6H11)PH2, AS THE ORGANOPHOSPHORUS SOURCE COMPOUND, Thin solid films, 315(1-2), 1998, pp. 86-93
The organophosphorus compound cyclohexylphosphine ((C6H11)PH2, PCH) wi
th trimethylindium (TMI) cleanly forms thin films of crystalline indiu
m phosphide (InP) under pyrolytic CVD conditions. These depositions ar
e shown by Auger electron spectroscopy (AES) and other methods to be p
olycrystalline InP. Depositions were performed on both silicon (Si) an
d InP(100) substrates at temperatures and V/III ratios comparable to t
hose employed in literature InP depositions with other phosphorus sour
ce compounds. The deposited materials were characterized by scanning e
lectron microscopy (SEM), energy dispersive X-ray spectroscopy (EDX),
AES and X-ray thin film diffraction (XRD). The effect of precursor flo
w rates, V/III ratios, and substrate temperatures on the morphologies
and compositions of the deposited InP materials was also investigated
for the cyclohexylphosphine-based depositions. (C) 1998 Elsevier Scien
ce S.A.