EPITAXIAL-GROWTH WITH PHOSPHORUS - 3 - FORMATION OF INDIUM-PHOSPHIDE THIN-FILMS USING CYCLOHEXYLPHOSPHINE, (C6H11)PH2, AS THE ORGANOPHOSPHORUS SOURCE COMPOUND

Citation
Ja. Glass et Jt. Spencer, EPITAXIAL-GROWTH WITH PHOSPHORUS - 3 - FORMATION OF INDIUM-PHOSPHIDE THIN-FILMS USING CYCLOHEXYLPHOSPHINE, (C6H11)PH2, AS THE ORGANOPHOSPHORUS SOURCE COMPOUND, Thin solid films, 315(1-2), 1998, pp. 86-93
Citations number
20
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
315
Issue
1-2
Year of publication
1998
Pages
86 - 93
Database
ISI
SICI code
0040-6090(1998)315:1-2<86:EWP-3->2.0.ZU;2-F
Abstract
The organophosphorus compound cyclohexylphosphine ((C6H11)PH2, PCH) wi th trimethylindium (TMI) cleanly forms thin films of crystalline indiu m phosphide (InP) under pyrolytic CVD conditions. These depositions ar e shown by Auger electron spectroscopy (AES) and other methods to be p olycrystalline InP. Depositions were performed on both silicon (Si) an d InP(100) substrates at temperatures and V/III ratios comparable to t hose employed in literature InP depositions with other phosphorus sour ce compounds. The deposited materials were characterized by scanning e lectron microscopy (SEM), energy dispersive X-ray spectroscopy (EDX), AES and X-ray thin film diffraction (XRD). The effect of precursor flo w rates, V/III ratios, and substrate temperatures on the morphologies and compositions of the deposited InP materials was also investigated for the cyclohexylphosphine-based depositions. (C) 1998 Elsevier Scien ce S.A.