The fatigue life estimation of solder joints is one of the most critic
al requirements in the development of reliable electronic components.
In this study, we first examined a constitutive model for Sn63-Pb37 so
lder based on the results of material tests. It was confirmed that the
behavior of the solder material can be expressed by the elastic-creep
constitutive equations when the strain rate was low. Secondly, elasti
c-creep stress analysis was carried out for the solder joints of a SMT
-PGA (surface mount technology pin grid array) package. The location o
f the failure predicted by the analytical results agreed well with tho
se of the thermal cycle tests (TCT). It was shown that the fatigue lif
e estimation of solder joints based on the present method is satisfact
ory for engineering purposes.