Quantum Hall devices have been investigated in the regime of the break
down of dissipationless current flow by means of a photoresistance ima
ging technique. It is possible to distinguish three stages in developm
ent of the breakdown: (i) the initial rise of the longitudinal resista
nce due to a change with the Hall electric field of the percolation th
reshold leading to electron backscattering between the edges; (ii) at
higher bias currents a strong response from the edges is observed in t
wo-dimensional images, in agreement with the edge-state model; (iii) o
n increasing the bias current further, electron heating effects are se
en to prevail.