CALCULATION OF THE X-RAY-FLUORESCENCE INTENSITY AND DETECTOR COUNT RATE FOR ANNULAR SOURCE GEOMETRY

Expressions for X-ray fluorescence spectroscopy described in a previou s paper, were extended for the calculation of the fluorescence intensi ty of a thin specimen, providing a detector count rate with a precisio n of better than 0.2%. The results are presented in the form of delta( xi(1)eta(1 - )xi(2)eta(2)) where eta(1) and eta(2) are the standard fu nctions common to all cylindrical geometry systems of any size, delta, and where xi(1) and xi(2) are user calculable coefficients.