SYNDROME SIGNATURE IN OUTPUT COMPACTION FOR VLSI BUILT-IN SELF-TEST

In this paper, we focus on the use of signature-based output compactio n technique for built-in self-testing of VLSI circuits, We give algori thm for single-output and multiple-output signature generation using e xhaustive test patterns extending the syndrome concept. The signature we develop is a functional signature and is very effective for both in put and internal line fault detection, as seen from simulation on vari ous benchmark circuits. The signature generators can be easily impleme nted using the current VLSI technology.