The influence of the deposition rate on the morphology of epitaxial Sb
layers on GaAs(110) is investigated. Layers with a nominal thickness
of 30 monolayers (ML) were deposited with varying deposition rates (10
to 0.03 ML/min) on substrates kept at room temperature. Characterizat
ion techniques employed are Raman scattering, low energy electron diff
raction (LEED), X-ray reflectivity and scanning probe microscopy. A wi
de variation of layer morphology is obtained dependent on the depositi
on rate: lowering the deposition rate generally results in larger isla
nd size and rougher surfaces. In most cases, the Sb layer is of rhombo
hedral structure. However, in a very narrow range of deposition rates,
we found a growth mode of Sb, which is similar to a pseudo-cubic phas
e. This phase was found so far only for a thickness below 15 ML after
annealing at 475 K. (C) 1998 Elsevier Science S,A.