INVESTIGATION ON THE RELATION BETWEEN THE THICKNESS AND THE ORIENTATION OF EPITAXIALLY GROWN YBCO THIN-FILMS BY LASER-ABLATION

Citation
Jh. Park et al., INVESTIGATION ON THE RELATION BETWEEN THE THICKNESS AND THE ORIENTATION OF EPITAXIALLY GROWN YBCO THIN-FILMS BY LASER-ABLATION, Thin solid films, 318(1-2), 1998, pp. 243-246
Citations number
11
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
318
Issue
1-2
Year of publication
1998
Pages
243 - 246
Database
ISI
SICI code
0040-6090(1998)318:1-2<243:IOTRBT>2.0.ZU;2-Y
Abstract
Highly c-axis oriented YBCO thin films have been grown on MgO substrat es by laser ablation. A Nd:YAG laser was used to fabricate YBCO thin f ilms. The wavelength of the laser can be chosen among 355 nm, 532 nm, and 1064 nm. By varying the thickness and the film deposition temperat ure of the thin films, we observed the changes of the film orientation s. We can get highly c-axis oriented double-sided YBCO thin films by o ptimizing the thickness and the deposition temperature of YBCO thin fi lms. The thin films were systematically investigated using Raman spect roscopy and X-Ray diffraction to ensure the relation between the orien tations and the thickness of the thin films. (C) 1998 Elsevier Science S.A.