NEW X-RAY-DIFFRACTION METHOD FOR MATERIALS SCIENCE

A new and very promising X-ray diffraction method for the texture and internal stress investigation is described, This method, based on the conventional pole figure measurements in the back-reflection technique , affords possibilities for investigations of the diffraction effects due to layers on a given depth in a material. The condition of constan t information depth is attained by abandoning the Bragg-Brentano local ization geometry, using an appropriate offset angle for each sample ti lt angle. During such measurement, after selection of the adequate off set angle, its corresponding change proceeds automatically. In order t o obtain satisfactory integrated intensities, a pseudo-position sensit ive detection technique is applied. The proposed method in this non-sy mmetrical mode is both a recommendable and useful tool for studying te xtured and epitaxial thin films as well as multi-layer systems. (C) 19 98 Published by Elsevier Science S.A.