TEM OBSERVATIONS OF NANOMETER THICK COBALT DEPOSITS IN ALUMINA SANDWICHES

Authors
FETTAR F MAURICE JL PETROFF F SCHELP LF VAURES A FERT A
Citation
F. Fettar et al., TEM OBSERVATIONS OF NANOMETER THICK COBALT DEPOSITS IN ALUMINA SANDWICHES, Thin solid films, 319(1-2), 1998, pp. 120-123
Citations number
3
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
Thin solid films → ACNP
ISSN journal
00406090
Volume
319
Issue
1-2
Year of publication
1998
Pages
120 - 123
Database
ISI
SICI code
0040-6090(1998)319:1-2<120:TOONTC>2.0.ZU;2-8
Abstract
We present an analytical transmission electron microscopy (TEM, EDX mi croanalysis) study of cobalt clusters embedded in amorphous alumina th in films. We derived the size (average and standard deviation) and the density of clusters from the quantitative analysis of images taken at different defocus values. We additionally measured the cobalt/aluminu m ratio by EDX and deduced the density of the amorphous alumina from t he comparison of these results with thickness data. (C) 1998 Elsevier Science S.A.