High-resolution electron microscopy has been used to characterize the
structure of ultra-thin films of titanium deposited on KBr substrate b
y ultra-high Vacuum (UHV) electron-gun evaporation. The size of the gr
ains has an order of magnitude of 10 nm whatever is the substrate temp
erature. The observations have been carried out along the [11 (2) over
bar 3] zone axis. Some of the grains contain planar defects that were
identified as the twin {10 (1) over bar 1}. The atomic structure of t
his twin is characterized by a mirror plane similar to that observed i
n polycrystalline titanium; Additionally, this structure can be modifi
ed by a b(2/2) twinning dislocation. (C) 1998 Published by Elsevier Sc
ience S.A.