M. Maret et al., INVESTIGATION OF CHEMICAL ORDERING IN MBE-GROWN COXPT1-X FILMS BY X-RAY-DIFFRACTION AND HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY, Thin solid films, 319(1-2), 1998, pp. 191-196
From X-ray diffraction (XRD) measurements, long-range chemical orderin
g along the growth direction is observed in epitaxial(0001) CoxPt1-x (
x similar to 0.8) alloy films. Such ordering increases with the deposi
tion temperature up to 690 K, together with the volume fraction of hcp
stacking sequence, and also depends on the crystalline quality of the
epitaxial film. In contrast, no chemical order was detected in the (0
001) planes. Digital processing of cross-sectional high-resolution tra
nsmission electron microscopy (HRTEM) images shows that a chemical ord
er along the growth direction [111] also exists in the minority fcc ph
ase of a Co82Pt18 film grown at 690 K. (C) 1998 Published by Elsevier
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