INVESTIGATION OF CHEMICAL ORDERING IN MBE-GROWN COXPT1-X FILMS BY X-RAY-DIFFRACTION AND HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY

Citation
M. Maret et al., INVESTIGATION OF CHEMICAL ORDERING IN MBE-GROWN COXPT1-X FILMS BY X-RAY-DIFFRACTION AND HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY, Thin solid films, 319(1-2), 1998, pp. 191-196
Citations number
8
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
319
Issue
1-2
Year of publication
1998
Pages
191 - 196
Database
ISI
SICI code
0040-6090(1998)319:1-2<191:IOCOIM>2.0.ZU;2-O
Abstract
From X-ray diffraction (XRD) measurements, long-range chemical orderin g along the growth direction is observed in epitaxial(0001) CoxPt1-x ( x similar to 0.8) alloy films. Such ordering increases with the deposi tion temperature up to 690 K, together with the volume fraction of hcp stacking sequence, and also depends on the crystalline quality of the epitaxial film. In contrast, no chemical order was detected in the (0 001) planes. Digital processing of cross-sectional high-resolution tra nsmission electron microscopy (HRTEM) images shows that a chemical ord er along the growth direction [111] also exists in the minority fcc ph ase of a Co82Pt18 film grown at 690 K. (C) 1998 Published by Elsevier Science S.A.