MICROSTRUCTURE AND STRAIN RELAXATION IN YBA2CU3O7 EPITAXIAL THIN-FILMS

Authors
MAURICE JL DURAND O DROUET M CONTOUR JP
Citation
Jl. Maurice et al., MICROSTRUCTURE AND STRAIN RELAXATION IN YBA2CU3O7 EPITAXIAL THIN-FILMS, Thin solid films, 319(1-2), 1998, pp. 211-214
Citations number
9
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
Thin solid films → ACNP
ISSN journal
00406090
Volume
319
Issue
1-2
Year of publication
1998
Pages
211 - 214
Database
ISI
SICI code
0040-6090(1998)319:1-2<211:MASRIY>2.0.ZU;2-O
Abstract
We present X-ray diffraction (XRD) and transmission electron microscop y (TEM) observations of microstructure and strain relaxation in YBa2Cu 3O7 (YBCO) thin films grown on SrTiO3 (STO). The observations confirm the existence of twins in the relaxed layers and their absence in the strained ones. Dislocations are also present at the interface. We disc uss the respective roles of twins and dislocations in the relaxation p rocess. (C) 1998 Published by Elsevier Science S.A.